H_and_V_shadowing_across_EUV_slit.png


Summary

Description
English: Horizontal and vertical lines exhibit different shadowing across the slit of an EUV scanner. Vertical lines have less severe but a wider range of shadowing than horizontal lines. [1] The smaller pitch has worse shadowing in all cases.
Date
Source Own work
Author Guiding light

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References

  1. Horizontal, Vertical, and Slanted Line Shadowing Across Slit in EUV Lithography Systems

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7 January 2022

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